Welcome to the Microscopy and Microanalysis Facility

Managed by the Materials Department and open to all members of the university and surrounding community, this facility houses state-of-the-art equipment for materials characterization. 

Instruments include 2 transmission electron microscopes (TEMs), 2 focused ion beam microscopes, 3 field-emission scanning electron microscopes (SEMs), 2 atomic force microscopes (AFMs), an atom probe field ion microscope and dedicated X-ray photoelectron spectrometer (XPS) and dynamic secondary ion mass spectrometer (DSIMS) systems. Advanced sample preparation and computational resources ensure excellent sample quality and high-end data analysis.


The microscopy facility provides leading edge techniques and methods, catering to the needs of the research community. Comprehensive training is strongly emphasized with the goal of enabling graduate student researchers to fully exploit the powerful tools.


Continued support by the Materials Research Laboratory NSF MRSEC is acknowledged. Publications from equipment in the facility should have the following acknowledgement: “The MRL Shared Experimental Facilities are supported by the MRSEC Program of the NSF under Award No. DMR 1720256; a member of the NSF-funded Materials Research Facilities Network (www.mrfn.org).”

Latest News

Latest Microscopy News
SPECTRA intrument

Thermo Scientific Spectra 200 Installed in the Microscopy and Microanalysis Facility.

Spectra 200, a high throughput TEM and STEM microscope for various applications, has been installed in the Microscopy and Microanalysis facility. The new probe-corrected TEM can generate a fine probe size of less than an angstrom (≤0.6 Å). Combining this technology with a Super-X detector provides chemical composition at the atomic scale. This technology allows for discovering new details and for unveiling new research avenues. For more details, please visit CONVERGENCE magazine.



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1st floor of Elings Hall (California Nanosystems Institute)
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