The following information is intended to facilitate access and use of the instruments.

Learning opportunities are provided in form of individual training on the instruments, workshops covering in-depth information about specific topics as well as classes that give a broader perspective on a particular technique. Additional resources will be provided in form of written tutorials, procedures, and an extended bibliography of books and relevant articles (in preparation).


All users of the facility need to include the following statement under Acknowledgments in papers submitted for publication:

This work made use of MRL Central Facilities supported by the MRSEC Program of the National Science Foundation under award No. DMR 1121053


Safety Training

As a precondition for using the Microscopy Facility users need to be familiar with relevant safety regulations and register with the UC Lab Hazard Assessment Tool (LHAT). The following steps will guide you through the process:


Every user must complete the Fundamentals of Laboratory Safety training (LS60 or LS01) provided by EH&S. All students must attend the live version of this training (LS01). Please check the link below for scheduling.

UCSB Environmental Health and Safety – Training Schedules


Every user then needs to send an email to requesting an invitation to join the lab.

The invitation will provide a link to the LHAT website (see also the link below), where you can log in using your UCSBnetID, and join our lab, the Microscopy Facility. (You can find it by searching for Arda Genc as the PI.)

UC Lab Hazard Assessment Tool


After confirming your LHAT assessment and completing the PPE training, please contact to be added to the list of eligible users. Include electronic copies of both your PPE voucher and proof of safety training, and request that a TNA (training needs assessment) form be sent to the lab manager who will be working with you. You will then be sent an invitation to join one of our lab-specific safety tours.


Contact the responsible facility manager to set up training on the desired instrument. At the beginning of the first session, the manager will guide you through safety procedures that are relevant to the microscopy facility.


Instrument Training Instructions

If you want to schedule an instrument training, please contact

Lab Access

Users who are new to campus need to purchase a UC Access ID card at the University Center. (See the following link for more information).

Official University ID Card

The card can be purchased without further application. If the card is purchased by a Department via a UC account, use the form below to provide the corresponding information:

UCSB Access ID Card Application

At the end of the training cycle users will be approved to apply for key access to the relevant doors which can be done using the following online access application form (the UC Access ID card number is needed here):

California NanoSystems Institute Access Application



Individual Training

Basic training on instruments is done one-on-one and comprises typically three sessions.

Continued training will depend on the specific needs of the user. Please see below for general learning opportunities.


The list below gives an overview of upcoming classes that are related to work done in the facilities.

  • Electron Microscopy II: Crystalline Materials
    Prof D. Gianola
  • Cystallography and Diffraction Fundamentals
    Prof J. Speck
  • Advanced Transmission Electron Microscopy
    Prof S. Stemmer


Introductory Bibliography

The following list of books is intended to help novice users to get acquainted with the techniques available in the Microscopy Lab.

  • AFM
    Atomic Force Microscopy
    Peter Eaton, Paul West; Oxford University Press (2010)
  • APT
    Local Electrode Atom Probe Tomography: A User's Guide
    David J Larson, Ty J Prosa, Robert M Ulfig, Brian P Geiser, Thomas F Kelly; Springer (2013)
  • FIB
    Introduction to Focused Ion Beam (Instrumentation, Theory, Techniques and Practices)
    Edited by Lucille A Giannuzzi and Fred A Stevie; Springer (2005)
  • SEM
    Scanning Electron Microscopy and X-Ray Microanalysis
    Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin, Eric Lifshin, Linda Wasyer, Joseph Michaels; Springer (2007)
  • SIMS    
    Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
    RG Stevie, CW Magee; John Wiley and Sons (1989)
  • TEM    
    Transmission Electron Microscopy: A Textbook for Materials Science (4 Vol set)
    David B Williams, C Barry Carter; Springer (2009)
  • XPS    
    Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy
    D Briggs, JT Grant; IM Publications (2003)